APA (7th ed.) Citation

Jang, H., Cho, S., Jeon, D. S., Kang, D., Song, M., Park, C., . . . Kim, M. H. (2023). Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging. IEEE Transactions on Semiconductor Manufacturing, 36(3), 486. https://doi.org/10.1109/TSM.2023.3280897

Chicago Style (17th ed.) Citation

Jang, Hyeonjoong, Sanghoon Cho, Daniel S. Jeon, Dahyun Kang, Myeongho Song, Changhyun Park, Jaewon Kim, and Min H. Kim. "Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging." IEEE Transactions on Semiconductor Manufacturing 36, no. 3 (2023): 486. https://doi.org/10.1109/TSM.2023.3280897.

MLA (9th ed.) Citation

Jang, Hyeonjoong, et al. "Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging." IEEE Transactions on Semiconductor Manufacturing, vol. 36, no. 3, 2023, p. 486, https://doi.org/10.1109/TSM.2023.3280897.