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Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging.

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Title: Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging.
Authors: Jang, Hyeonjoong1, Cho, Sanghoon2, Jeon, Daniel S.1, Kang, Dahyun1, Song, Myeongho2, Park, Changhyun2, Kim, Jaewon2, Kim, Min H.1, minhkim@kaist.ac.kr
Source: IEEE Transactions on Semiconductor Manufacturing; Aug2023, Vol. 36 Issue 3, p486-493, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 170043076
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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      – Type: doi
        Value: 10.1109/TSM.2023.3280897
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 486
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      – TitleFull: Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging.
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            – D: 01
              M: 08
              Text: Aug2023
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              Y: 2023
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            – TitleFull: IEEE Transactions on Semiconductor Manufacturing
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