Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging. - Jang, Hyeonjoong; Cho, Sanghoon; Jeon, Daniel S.; Kang, Dahyun; Song, Myeongho; Park, Changhyun; Kim, Jaewon; Kim, Min H. (IEEE Transactions on Semiconductor Manufacturing, 2023)