Miyaoka, Y., Maeyama, M., Yamano, Y., & Inada, Y. (2024). Internal State of Fuse Arc Differentiating Interruption Success and Failure in Fuse‐Semiconductor DC Circuit Breaker. IEEJ Transactions on Electrical & Electronic Engineering, 19(1), 41. https://doi.org/10.1002/tee.23928
Chicago Style (17th ed.) CitationMiyaoka, Yuta, Mitsuaki Maeyama, Yasushi Yamano, and Yuki Inada. "Internal State of Fuse Arc Differentiating Interruption Success and Failure in Fuse‐Semiconductor DC Circuit Breaker." IEEJ Transactions on Electrical & Electronic Engineering 19, no. 1 (2024): 41. https://doi.org/10.1002/tee.23928.
MLA (9th ed.) CitationMiyaoka, Yuta, et al. "Internal State of Fuse Arc Differentiating Interruption Success and Failure in Fuse‐Semiconductor DC Circuit Breaker." IEEJ Transactions on Electrical & Electronic Engineering, vol. 19, no. 1, 2024, p. 41, https://doi.org/10.1002/tee.23928.