Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution.
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| Title: | Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution. |
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| Authors: | Bilanych, V.S.1, Shylenko, O.2, Vorobiov, S.2, Soroka, S.2, Bilanych, V.V.1, Rizak, V.1, Lytvyn, P.M.3, Loya, V. Yu4, Feher, A.2, Komanicky, V.1,2, vladimir.komanicky@upjs.sk |
| Source: | Thin Solid Films; Jan2024, Vol. 789, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00406090 |
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| DOI: | 10.1016/j.tsf.2023.140162 |
