Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution.

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Title: Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution.
Authors: Bilanych, V.S.1, Shylenko, O.2, Vorobiov, S.2, Soroka, S.2, Bilanych, V.V.1, Rizak, V.1, Lytvyn, P.M.3, Loya, V. Yu4, Feher, A.2, Komanicky, V.1,2, vladimir.komanicky@upjs.sk
Source: Thin Solid Films; Jan2024, Vol. 789, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 174666094
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution.
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  Data: <searchLink fieldCode="JN" term="%22Thin+Solid+Films%22">Thin Solid Films</searchLink>; Jan2024, Vol. 789, pN.PAG-N.PAG, 1p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=174666094
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        Value: 10.1016/j.tsf.2023.140162
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      – Code: eng
        Text: English
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      – TitleFull: Evaluation of dynamics of charge accumulation and dissipation processes in Ge15Se85 thin film under electron beam irradiation by mapping surface potential distribution.
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              Text: Jan2024
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