Cao, S., Sun, X., Bo, L., Wu, R., Li, B., Wu, X., . . . Liu, W. (2024). Learning to Detect Memory-related Vulnerabilities. ACM Transactions on Software Engineering & Methodology, 33(2), 1. https://doi.org/10.1145/3624744
Chicago Style (17th ed.) CitationCao, Sicong, Xiaobing Sun, Lili Bo, Rongxin Wu, Bin Li, Xiaoxue Wu, Chuanqi Tao, Tao Zhang, and Wei Liu. "Learning to Detect Memory-related Vulnerabilities." ACM Transactions on Software Engineering & Methodology 33, no. 2 (2024): 1. https://doi.org/10.1145/3624744.
MLA (9th ed.) CitationCao, Sicong, et al. "Learning to Detect Memory-related Vulnerabilities." ACM Transactions on Software Engineering & Methodology, vol. 33, no. 2, 2024, p. 1, https://doi.org/10.1145/3624744.
Warning: These citations may not always be 100% accurate.