APA (7th ed.) Citation

Gao, X., Dai, L., Liu, Y., Wang, K., Karpinsky, D. V., Liu, L., & Wang, Y. (2024). Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm. Journal of the American Ceramic Society, 107(5), 3301. https://doi.org/10.1111/jace.19639

Chicago Style (17th ed.) Citation

Gao, Xuan, Le Dai, Yang Liu, Ke Wang, D. V. Karpinsky, Lisha Liu, and Yaojin Wang. "Reliable Ferroelectricity in Sol–gel‐derived BiFeO3 Thin Films Below 200 nm." Journal of the American Ceramic Society 107, no. 5 (2024): 3301. https://doi.org/10.1111/jace.19639.

MLA (9th ed.) Citation

Gao, Xuan, et al. "Reliable Ferroelectricity in Sol–gel‐derived BiFeO3 Thin Films Below 200 nm." Journal of the American Ceramic Society, vol. 107, no. 5, 2024, p. 3301, https://doi.org/10.1111/jace.19639.