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Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm.

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Bibliographic Details
Title: Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm.
Authors: Gao, Xuan1, Dai, Le1, Liu, Yang1, Wang, Ke2, Karpinsky, D. V.3, Liu, Lisha1, lishaliu@njust.edu.cn, Wang, Yaojin1, yjwang@njust.edu.cn
Source: Journal of the American Ceramic Society; May2024, Vol. 107 Issue 5, p3301-3312, 12p
Database: Applied Science & Technology Source
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ISSN:00027820
DOI:10.1111/jace.19639