Schuetzke, J., Schweidler, S., Muenke, F. R., Orth, A., Khandelwal, A. D., Breitung, B., . . . Reischl, M. (2024). Accelerating Materials Discovery: Automated Identification of Prospects from X‐Ray Diffraction Data in Fast Screening Experiments. Advanced Intelligent Systems (2640-4567), 6(3), 1. https://doi.org/10.1002/aisy.202300501
Chicago Style (17th ed.) CitationSchuetzke, Jan, Simon Schweidler, Friedrich R. Muenke, Andre Orth, Anurag D. Khandelwal, Ben Breitung, Jasmin Aghassi‐Hagmann, and Markus Reischl. "Accelerating Materials Discovery: Automated Identification of Prospects from X‐Ray Diffraction Data in Fast Screening Experiments." Advanced Intelligent Systems (2640-4567) 6, no. 3 (2024): 1. https://doi.org/10.1002/aisy.202300501.
MLA (9th ed.) CitationSchuetzke, Jan, et al. "Accelerating Materials Discovery: Automated Identification of Prospects from X‐Ray Diffraction Data in Fast Screening Experiments." Advanced Intelligent Systems (2640-4567), vol. 6, no. 3, 2024, p. 1, https://doi.org/10.1002/aisy.202300501.