Accelerating Materials Discovery: Automated Identification of Prospects from X‐Ray Diffraction Data in Fast Screening Experiments. - Schuetzke, Jan; Schweidler, Simon; Muenke, Friedrich R.; Orth, Andre; Khandelwal, Anurag D.; Breitung, Ben; Aghassi‐Hagmann, Jasmin; Reischl, Markus (Advanced Intelligent Systems (2640-4567), 2024)