APA (7th ed.) Citation

Benaicha, I., Ait-Alla, Y., Mhalla, J., BakkalI, R., Daoudi, O., Jelall, I., . . . Qachaou, A. (2024). SILAR-engineered ZnO thin films: Exploring the impact of Ni, Co, and Fe dopants on structural, optical, and electronic properties. Journal of Materials Science: Materials in Electronics, 35(13), 1. https://doi.org/10.1007/s10854-024-12678-2

Chicago Style (17th ed.) Citation

Benaicha, Ismail, Youness Ait-Alla, Jaouad Mhalla, Ridouane BakkalI, Othmane Daoudi, Ilyass Jelall, Khalid Nouneh, Mounir Fahoume, and Ahmed Qachaou. "SILAR-engineered ZnO Thin Films: Exploring the Impact of Ni, Co, and Fe Dopants on Structural, Optical, and Electronic Properties." Journal of Materials Science: Materials in Electronics 35, no. 13 (2024): 1. https://doi.org/10.1007/s10854-024-12678-2.

MLA (9th ed.) Citation

Benaicha, Ismail, et al. "SILAR-engineered ZnO Thin Films: Exploring the Impact of Ni, Co, and Fe Dopants on Structural, Optical, and Electronic Properties." Journal of Materials Science: Materials in Electronics, vol. 35, no. 13, 2024, p. 1, https://doi.org/10.1007/s10854-024-12678-2.