Guo, X., Okamura, H., & Dohi, T. (2024). Optimal test case generation for boundary value analysis. Software Quality Journal, 32(2), 543. https://doi.org/10.1007/s11219-023-09659-9
Chicago Style (17th ed.) CitationGuo, Xiujing, Hiroyuki Okamura, and Tadashi Dohi. "Optimal Test Case Generation for Boundary Value Analysis." Software Quality Journal 32, no. 2 (2024): 543. https://doi.org/10.1007/s11219-023-09659-9.
MLA (9th ed.) CitationGuo, Xiujing, et al. "Optimal Test Case Generation for Boundary Value Analysis." Software Quality Journal, vol. 32, no. 2, 2024, p. 543, https://doi.org/10.1007/s11219-023-09659-9.
Warning: These citations may not always be 100% accurate.