An, J., & Shi, Z. (2024). YOLOv8n-Enhanced PCB Defect Detection: A Lightweight Method Integrating Spatial–Channel Reconstruction and Adaptive Feature Selection. Applied Sciences (2076-3417), 14(17), 7686. https://doi.org/10.3390/app14177686
Chicago Style (17th ed.) CitationAn, Jiayang, and Zhichao Shi. "YOLOv8n-Enhanced PCB Defect Detection: A Lightweight Method Integrating Spatial–Channel Reconstruction and Adaptive Feature Selection." Applied Sciences (2076-3417) 14, no. 17 (2024): 7686. https://doi.org/10.3390/app14177686.
MLA (9th ed.) CitationAn, Jiayang, and Zhichao Shi. "YOLOv8n-Enhanced PCB Defect Detection: A Lightweight Method Integrating Spatial–Channel Reconstruction and Adaptive Feature Selection." Applied Sciences (2076-3417), vol. 14, no. 17, 2024, p. 7686, https://doi.org/10.3390/app14177686.