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X-ray sources for in situ wavelength calibration of x-ray imaging crystal spectrometers.

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Title: X-ray sources for in situ wavelength calibration of x-ray imaging crystal spectrometers.
Authors: Shah, K.1, kshah2@pppl.gov, Delgado-Aparicio, L.1, Kraus, B. F.1, Ono, M.1, Gao, L.1, Umbach, B.1, Perkins, L.1, Pablant, N.1, Hill, K. W.1, Bitter, M.1, Teall, S.2, Drake, R.2, Schmidt, G.2
Source: Review of Scientific Instruments; Sep2024, Vol. 95 Issue 9, p1-6, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 180002428
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; Sep2024, Vol. 95 Issue 9, p1-6, 6p
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        Value: 10.1063/5.0219583
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        Text: English
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              M: 09
              Text: Sep2024
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              Y: 2024
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