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A novel defect prediction method based on semantic feature enhancement.

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Bibliographic Details
Title:	A novel defect prediction method based on semantic feature enhancement.
Authors:	Zhang, Chi^1,2, Wang, Xiaoli^1,2, Chen, Jinfu^1,2, jinfuchen@ujs.edu.cn, Cai, Saihua^1,2, Nii Ayitey Sosu, Rexford^1,3
Source:	Journal of Software: Evolution & Process; Sep2024, Vol. 36 Issue 9, p1-15, 15p
Database:	Applied Science & Technology Source
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Description
ISSN:	20477473
DOI:	10.1002/smr.2674