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A novel defect prediction method based on semantic feature enhancement.

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Title: A novel defect prediction method based on semantic feature enhancement.
Authors: Zhang, Chi1,2, Wang, Xiaoli1,2, Chen, Jinfu1,2, jinfuchen@ujs.edu.cn, Cai, Saihua1,2, Nii Ayitey Sosu, Rexford1,3
Source: Journal of Software: Evolution & Process; Sep2024, Vol. 36 Issue 9, p1-15, 15p
Database: Applied Science & Technology Source
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PubType: Academic Journal
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        Value: 10.1002/smr.2674
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      – Code: eng
        Text: English
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              Text: Sep2024
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              Y: 2024
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