APA (7th ed.) Citation

Kang, T. Y., Lee, H., & Suh, S. (2024). Non-destructive fault diagnosis of electronic interconnects by learning signal patterns of reflection coefficient in the frequency domain. Microelectronics Reliability, 162, N.PAG. https://doi.org/10.1016/j.microrel.2024.115518

Chicago Style (17th ed.) Citation

Kang, Tae Yeob, Haebom Lee, and Sungho Suh. "Non-destructive Fault Diagnosis of Electronic Interconnects by Learning Signal Patterns of Reflection Coefficient in the Frequency Domain." Microelectronics Reliability 162 (2024): N.PAG. https://doi.org/10.1016/j.microrel.2024.115518.

MLA (9th ed.) Citation

Kang, Tae Yeob, et al. "Non-destructive Fault Diagnosis of Electronic Interconnects by Learning Signal Patterns of Reflection Coefficient in the Frequency Domain." Microelectronics Reliability, vol. 162, 2024, p. N.PAG, https://doi.org/10.1016/j.microrel.2024.115518.