Wang, X., Muqeet, A., Yue, T., Ali, S., & Arcaini, P. (2025). Test Case Minimization with Quantum Annealers. ACM Transactions on Software Engineering & Methodology, 34(1), 1. https://doi.org/10.1145/3680467
Chicago Style (17th ed.) CitationWang, Xinyi, Asmar Muqeet, Tao Yue, Shaukat Ali, and Paolo Arcaini. "Test Case Minimization with Quantum Annealers." ACM Transactions on Software Engineering & Methodology 34, no. 1 (2025): 1. https://doi.org/10.1145/3680467.
MLA (9th ed.) CitationWang, Xinyi, et al. "Test Case Minimization with Quantum Annealers." ACM Transactions on Software Engineering & Methodology, vol. 34, no. 1, 2025, p. 1, https://doi.org/10.1145/3680467.
Warning: These citations may not always be 100% accurate.