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Test Case Minimization with Quantum Annealers.

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Bibliographic Details
Title: Test Case Minimization with Quantum Annealers.
Authors: Wang, Xinyi1, xinyi@simula.no, Muqeet, Asmar1, asmar@simula.no, Yue, Tao2, taoyue@gmail.com, Ali, Shaukat3, shaukat@simula.no, Arcaini, Paolo4, arcaini@nii.ac.jp
Source: ACM Transactions on Software Engineering & Methodology; Jan2025, Vol. 34 Issue 1, p1-24, 24p
Database: Applied Science & Technology Source
Description
ISSN:1049331X
DOI:10.1145/3680467