APA (7th ed.) Citation

Sivaraman, R., Magesh, S., Amruthavarshini, S., Aggarwal, M., Muralidharan, D., Muthaiah, R., & Sriram, V. S. S. (2025). Security in sequence: NIST-adherent design of a hybrid random number generator with SRAM-based PUF. Analog Integrated Circuits & Signal Processing, 123(1), 1. https://doi.org/10.1007/s10470-025-02352-w

Chicago Style (17th ed.) Citation

Sivaraman, R., Srinidhi Magesh, S. Amruthavarshini, Manuj Aggarwal, D. Muralidharan, R. Muthaiah, and V. S. Shankar Sriram. "Security in Sequence: NIST-adherent Design of a Hybrid Random Number Generator with SRAM-based PUF." Analog Integrated Circuits & Signal Processing 123, no. 1 (2025): 1. https://doi.org/10.1007/s10470-025-02352-w.

MLA (9th ed.) Citation

Sivaraman, R., et al. "Security in Sequence: NIST-adherent Design of a Hybrid Random Number Generator with SRAM-based PUF." Analog Integrated Circuits & Signal Processing, vol. 123, no. 1, 2025, p. 1, https://doi.org/10.1007/s10470-025-02352-w.