Security in sequence: NIST-adherent design of a hybrid random number generator with SRAM-based PUF.

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Bibliographic Details
Title: Security in sequence: NIST-adherent design of a hybrid random number generator with SRAM-based PUF.
Authors: Sivaraman, R.1, Magesh, Srinidhi2, Amruthavarshini, S.3, Aggarwal, Manuj4, Muralidharan, D.1, Muthaiah, R.1, Sriram, V. S. Shankar1, sriram@it.sastra.edu
Source: Analog Integrated Circuits & Signal Processing; Apr2025, Vol. 123 Issue 1, p1-24, 24p
Database: Applied Science & Technology Source
Description
ISSN:09251030
DOI:10.1007/s10470-025-02352-w