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Security in sequence: NIST-adherent design of a hybrid random number generator with SRAM-based PUF.

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Bibliographic Details
Title: Security in sequence: NIST-adherent design of a hybrid random number generator with SRAM-based PUF.
Authors: Sivaraman, R.1, Magesh, Srinidhi2, Amruthavarshini, S.3, Aggarwal, Manuj4, Muralidharan, D.1, Muthaiah, R.1, Sriram, V. S. Shankar1, sriram@it.sastra.edu
Source: Analog Integrated Circuits & Signal Processing; Apr2025, Vol. 123 Issue 1, p1-24, 24p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 183428882
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=183428882
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        Value: 10.1007/s10470-025-02352-w
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        Text: English
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      – TitleFull: Security in sequence: NIST-adherent design of a hybrid random number generator with SRAM-based PUF.
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              Text: Apr2025
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              Y: 2025
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