High-performance GaN HEMTs with GaON under-gate cap layer via barrier-friendly selective plasma oxidation.

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Bibliographic Details
Title: High-performance GaN HEMTs with GaON under-gate cap layer via barrier-friendly selective plasma oxidation.
Authors: He, J.1,2, Cheng, Z.1,2, Xie, S.1,2, Mi, C.1,2, Wu, X.1,2, Zhang, L.1, Zhang, Y.1,2, yzhang34@semi.ac.cn
Source: Applied Physics Letters; 4/1/2025, Vol. 126 Issue 14, p1-5, 5p
Database: Applied Science & Technology Source
Description
ISSN:00036951
DOI:10.1063/5.0260480