Analysis of the influence of defect evolution on the performance and damage of 4H-SiC photoconductive semiconductor switches. - Chen, Zhipeng; Huang, Zhuocheng; Sun, Qian; Xu, Kun; Lin, Zhouyang; Zheng, Zhong; Wu, Zhaoyang; Zhang, Wei; Guo, Hui; Liu, Yapeng; Zhang, Yuming; Peng, Bo; et al. (Journal of Applied Physics, 2025)