View in EDS HTML Full Text PDF Full Text

Influence of Annealing Temperature Variations on the Structural, Morphological, Optical and Electrical Properties of Ge35Se65 Thin Films.

Saved in:
Bibliographic Details
Title: Influence of Annealing Temperature Variations on the Structural, Morphological, Optical and Electrical Properties of Ge35Se65 Thin Films.
Authors: Alfaqeer, Abdel-naser A.1, El Sayed, Mohamed E.2, Alajlani, Yahya3, Murshed, Mohammad N.2,4, Alwany, Abduelwhab B.4,5,6, abdualwhab@yahoo.com, Alnehia, Adnan7, Samir, Ahmed2
Source: Journal of Electronic Materials; Jun2025, Vol. 54 Issue 6, p4863-4873, 11p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 185069784
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Influence of Annealing Temperature Variations on the Structural, Morphological, Optical and Electrical Properties of Ge35Se65 Thin Films.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Alfaqeer%2C+Abdel-naser+A%2E%22">Alfaqeer, Abdel-naser A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22El+Sayed%2C+Mohamed+E%2E%22">El Sayed, Mohamed E.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Alajlani%2C+Yahya%22">Alajlani, Yahya</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Murshed%2C+Mohammad+N%2E%22">Murshed, Mohammad N.</searchLink><relatesTo>2,4</relatesTo><br /><searchLink fieldCode="AU" term="%22Alwany%2C+Abduelwhab+B%2E%22">Alwany, Abduelwhab B.</searchLink><relatesTo>4,5,6</relatesTo>, <i>abdualwhab@yahoo.com</i><br /><searchLink fieldCode="AU" term="%22Alnehia%2C+Adnan%22">Alnehia, Adnan</searchLink><relatesTo>7</relatesTo><br /><searchLink fieldCode="AU" term="%22Samir%2C+Ahmed%22">Samir, Ahmed</searchLink><relatesTo>2</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Jun2025, Vol. 54 Issue 6, p4863-4873, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=185069784
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s11664-025-11890-y
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 11
        StartPage: 4863
    Titles:
      – TitleFull: Influence of Annealing Temperature Variations on the Structural, Morphological, Optical and Electrical Properties of Ge35Se65 Thin Films.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Alfaqeer, Abdel-naser A.
      – PersonEntity:
          Name:
            NameFull: El Sayed, Mohamed E.
      – PersonEntity:
          Name:
            NameFull: Alajlani, Yahya
      – PersonEntity:
          Name:
            NameFull: Murshed, Mohammad N.
      – PersonEntity:
          Name:
            NameFull: Alwany, Abduelwhab B.
      – PersonEntity:
          Name:
            NameFull: Alnehia, Adnan
      – PersonEntity:
          Name:
            NameFull: Samir, Ahmed
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 06
              Text: Jun2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 03615235
          Numbering:
            – Type: volume
              Value: 54
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: Journal of Electronic Materials
              Type: main
ResultId 1