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The microstructure and electrical property of M-doped (M = W, Cr) NbN thin films.

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Title: The microstructure and electrical property of M-doped (M = W, Cr) NbN thin films.
Authors: Lee, Ying-Chieh1,2, yc56@mail.nsysu.edu.tw, Yang, Hau3, Hong, Ting-Fu3, Shih, Huei-Jyun1, Lee, Wen-His4
Source: Journal of Materials Science: Materials in Electronics; Jun2025, Vol. 36 Issue 16, p1-13, 13p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 185803293
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: The microstructure and electrical property of M-doped (M = W, Cr) NbN thin films.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jun2025, Vol. 36 Issue 16, p1-13, 13p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=185803293
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        Value: 10.1007/s10854-025-15025-1
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      – Code: eng
        Text: English
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        PageCount: 13
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      – TitleFull: The microstructure and electrical property of M-doped (M = W, Cr) NbN thin films.
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            NameFull: Lee, Ying-Chieh
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            NameFull: Yang, Hau
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            NameFull: Hong, Ting-Fu
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            – D: 01
              M: 06
              Text: Jun2025
              Type: published
              Y: 2025
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              Value: 36
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