APA (7th ed.) Citation

Jiang, X., Feng, J., Yan, F., Lu, Y., Fa, Q., Zhang, W., & Xu, M. (2025). Foreground–background separation transformer for weakly supervised surface defect detection. Journal of Intelligent Manufacturing, 36(6), 4217. https://doi.org/10.1007/s10845-024-02446-8

Chicago Style (17th ed.) Citation

Jiang, Xiaoheng, Jian Feng, Feng Yan, Yang Lu, Quanhai Fa, Wenjie Zhang, and Mingliang Xu. "Foreground–background Separation Transformer for Weakly Supervised Surface Defect Detection." Journal of Intelligent Manufacturing 36, no. 6 (2025): 4217. https://doi.org/10.1007/s10845-024-02446-8.

MLA (9th ed.) Citation

Jiang, Xiaoheng, et al. "Foreground–background Separation Transformer for Weakly Supervised Surface Defect Detection." Journal of Intelligent Manufacturing, vol. 36, no. 6, 2025, p. 4217, https://doi.org/10.1007/s10845-024-02446-8.