P‐1.18: Analysis of Hump Characteristic under Positive Bias Temperature Stress in Amorphous InGaZnO Thin‐Film Transistors. - Zhou, Xiaoliang; Lin, Qingping; Sun, Hejing; Sun, Haozhou; Chen, Yanling; Tan, Zhiwei (SID Symposium Digest of Technical Papers, 2025)