APA (7th ed.) Citation

Hussain, A. (2025). POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES. International Journal of Advanced Research in Computer Science, 16(4), 146. https://doi.org/10.26483/ijarcs.v16i4.7321

Chicago Style (17th ed.) Citation

Hussain, Abid. "POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES." International Journal of Advanced Research in Computer Science 16, no. 4 (2025): 146. https://doi.org/10.26483/ijarcs.v16i4.7321.

MLA (9th ed.) Citation

Hussain, Abid. "POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES." International Journal of Advanced Research in Computer Science, vol. 16, no. 4, 2025, p. 146, https://doi.org/10.26483/ijarcs.v16i4.7321.