POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES.

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Bibliographic Details
Title:	POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES.
Authors:	Hussain, Abid¹
Source:	International Journal of Advanced Research in Computer Science; Jul/Aug2025, Vol. 16 Issue 4, p146-153, 8p
Database:	Applied Science & Technology Source

Description
ISSN:	09765697
DOI:	10.26483/ijarcs.v16i4.7321