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POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES.

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Title: POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES.
Authors: Hussain, Abid1
Source: International Journal of Advanced Research in Computer Science; Jul/Aug2025, Vol. 16 Issue 4, p146-153, 8p
Database: Applied Science & Technology Source
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        Value: 10.26483/ijarcs.v16i4.7321
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        Text: English
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      – TitleFull: POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES.
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              Text: Jul/Aug2025
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