POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES.
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| Title: | POWER-AWARE DESIGN-FOR-TESTABILITY IN SEMICONDUCTOR DEVICES: A REVIEW OF ENERGY-EFFICIENT TESTING STRATEGIES. |
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| Authors: | Hussain, Abid1 |
| Source: | International Journal of Advanced Research in Computer Science; Jul/Aug2025, Vol. 16 Issue 4, p146-153, 8p |
| Database: | Applied Science & Technology Source |
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