APA (7th ed.) Citation

Sivaraman, R., Kumar, H. N., Muralidharan, D., Muthaiah, R., & Sriram, V. S. S. (2025). Towards robust true random number generation: Addressing vulnerabilities in dual entropy source design. Analog Integrated Circuits & Signal Processing, 125(1), 1. https://doi.org/10.1007/s10470-025-02488-9

Chicago Style (17th ed.) Citation

Sivaraman, R., H. Naresh Kumar, D. Muralidharan, R. Muthaiah, and V. S. Shankar Sriram. "Towards Robust True Random Number Generation: Addressing Vulnerabilities in Dual Entropy Source Design." Analog Integrated Circuits & Signal Processing 125, no. 1 (2025): 1. https://doi.org/10.1007/s10470-025-02488-9.

MLA (9th ed.) Citation

Sivaraman, R., et al. "Towards Robust True Random Number Generation: Addressing Vulnerabilities in Dual Entropy Source Design." Analog Integrated Circuits & Signal Processing, vol. 125, no. 1, 2025, p. 1, https://doi.org/10.1007/s10470-025-02488-9.