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Towards robust true random number generation: addressing vulnerabilities in dual entropy source design.

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Title: Towards robust true random number generation: addressing vulnerabilities in dual entropy source design.
Authors: Sivaraman, R.1, Kumar, H. Naresh2, Muralidharan, D.1, Muthaiah, R.1, Sriram, V. S. Shankar1, sriram@it.sastra.edu
Source: Analog Integrated Circuits & Signal Processing; Oct2025, Vol. 125 Issue 1, p1-18, 18p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 187876515
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22Analog+Integrated+Circuits+%26+Signal+Processing%22">Analog Integrated Circuits & Signal Processing</searchLink>; Oct2025, Vol. 125 Issue 1, p1-18, 18p
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        Value: 10.1007/s10470-025-02488-9
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        Text: English
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              Text: Oct2025
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              Y: 2025
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