APA (7th ed.) Citation

Wang, L., Jiang, Z., Tan, Y., Song, J., Zhang, H., Zhu, X., . . . Xiao, K. (2025). Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor. Journal of Electronic Materials, 54(10), 9302. https://doi.org/10.1007/s11664-025-12265-z

Chicago Style (17th ed.) Citation

Wang, Luntao, Zixue Jiang, Yao Tan, Jialiang Song, Hao Zhang, Xianqin Zhu, Heqian Wang, Chaofang Dong, and Kui Xiao. "Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor." Journal of Electronic Materials 54, no. 10 (2025): 9302. https://doi.org/10.1007/s11664-025-12265-z.

MLA (9th ed.) Citation

Wang, Luntao, et al. "Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor." Journal of Electronic Materials, vol. 54, no. 10, 2025, p. 9302, https://doi.org/10.1007/s11664-025-12265-z.