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Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor.

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Title: Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor.
Authors: Wang, Luntao1, Jiang, Zixue1,2, Tan, Yao1, Song, Jialiang1, Zhang, Hao1, Zhu, Xianqin3, Wang, Heqian1, Dong, Chaofang1, Xiao, Kui1,4, xiaokui@sina.com
Source: Journal of Electronic Materials; Oct2025, Vol. 54 Issue 10, p9302-9314, 13p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 187974341
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor.
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  Data: <searchLink fieldCode="AU" term="%22Wang%2C+Luntao%22">Wang, Luntao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Jiang%2C+Zixue%22">Jiang, Zixue</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Tan%2C+Yao%22">Tan, Yao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Song%2C+Jialiang%22">Song, Jialiang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Hao%22">Zhang, Hao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhu%2C+Xianqin%22">Zhu, Xianqin</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Heqian%22">Wang, Heqian</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Dong%2C+Chaofang%22">Dong, Chaofang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Xiao%2C+Kui%22">Xiao, Kui</searchLink><relatesTo>1,4</relatesTo>, <i>xiaokui@sina.com</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Oct2025, Vol. 54 Issue 10, p9302-9314, 13p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=187974341
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1007/s11664-025-12265-z
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 13
        StartPage: 9302
    Titles:
      – TitleFull: Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor.
        Type: main
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            NameFull: Wang, Luntao
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            NameFull: Jiang, Zixue
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            NameFull: Tan, Yao
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            NameFull: Song, Jialiang
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            NameFull: Zhang, Hao
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            NameFull: Zhu, Xianqin
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            NameFull: Wang, Heqian
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            NameFull: Dong, Chaofang
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            NameFull: Xiao, Kui
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          Dates:
            – D: 01
              M: 10
              Text: Oct2025
              Type: published
              Y: 2025
          Identifiers:
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              Value: 03615235
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              Value: 54
            – Type: issue
              Value: 10
          Titles:
            – TitleFull: Journal of Electronic Materials
              Type: main
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