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Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor.

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Bibliographic Details
Title: Study of the Effect of Bias Voltage on the Electrochemical Migration Failure of Surface-Mount Resistor.
Authors: Wang, Luntao1, Jiang, Zixue1,2, Tan, Yao1, Song, Jialiang1, Zhang, Hao1, Zhu, Xianqin3, Wang, Heqian1, Dong, Chaofang1, Xiao, Kui1,4, xiaokui@sina.com
Source: Journal of Electronic Materials; Oct2025, Vol. 54 Issue 10, p9302-9314, 13p
Database: Applied Science & Technology Source
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