Voitsekhovskii, A. V., Dzyadukh, S. M., Gorn, D. I., Dvoretskii, S. A., Mikhailov, N. N., Sidorov, G. Y., & Yakushev, M. V. (2025). Determination of the Electrical Properties of the HgCdTe nB(SL)n-Based MIS Structure in a Wide Temperature Range. Journal of Communications Technology & Electronics, 70(2), 46. https://doi.org/10.1134/S106422692570010X
Chicago Style (17th ed.) CitationVoitsekhovskii, A. V., S. M. Dzyadukh, D. I. Gorn, S. A. Dvoretskii, N. N. Mikhailov, G. Yu Sidorov, and M. V. Yakushev. "Determination of the Electrical Properties of the HgCdTe NB(SL)n-Based MIS Structure in a Wide Temperature Range." Journal of Communications Technology & Electronics 70, no. 2 (2025): 46. https://doi.org/10.1134/S106422692570010X.
MLA (9th ed.) CitationVoitsekhovskii, A. V., et al. "Determination of the Electrical Properties of the HgCdTe NB(SL)n-Based MIS Structure in a Wide Temperature Range." Journal of Communications Technology & Electronics, vol. 70, no. 2, 2025, p. 46, https://doi.org/10.1134/S106422692570010X.