APA (7th ed.) Citation

Deng, C., Zhang, Y., Wu, Z., Wu, Y., Sun, X., & Wang, S. (2025). EH-YOLO: Dimensional Transformation and Hierarchical Feature Fusion-Based PCB Surface Defect Detection. Applied Sciences (2076-3417), 15(20), 10895. https://doi.org/10.3390/app152010895

Chicago Style (17th ed.) Citation

Deng, Chengzhi, You Zhang, Zhaoming Wu, Yingbo Wu, Xiaowei Sun, and Shengqian Wang. "EH-YOLO: Dimensional Transformation and Hierarchical Feature Fusion-Based PCB Surface Defect Detection." Applied Sciences (2076-3417) 15, no. 20 (2025): 10895. https://doi.org/10.3390/app152010895.

MLA (9th ed.) Citation

Deng, Chengzhi, et al. "EH-YOLO: Dimensional Transformation and Hierarchical Feature Fusion-Based PCB Surface Defect Detection." Applied Sciences (2076-3417), vol. 15, no. 20, 2025, p. 10895, https://doi.org/10.3390/app152010895.