Bae, J. I., Park, Y. I., & Kim, J. (2025). Quantitative Reliability Evaluation for Cryogenic Impact Test Equipment. Applied Sciences (2076-3417), 15(20), 11280. https://doi.org/10.3390/app152011280
Chicago Style (17th ed.) CitationBae, Jae Il, Young IL Park, and Jeong-Hwan Kim. "Quantitative Reliability Evaluation for Cryogenic Impact Test Equipment." Applied Sciences (2076-3417) 15, no. 20 (2025): 11280. https://doi.org/10.3390/app152011280.
MLA (9th ed.) CitationBae, Jae Il, et al. "Quantitative Reliability Evaluation for Cryogenic Impact Test Equipment." Applied Sciences (2076-3417), vol. 15, no. 20, 2025, p. 11280, https://doi.org/10.3390/app152011280.
Warning: These citations may not always be 100% accurate.