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Quantitative Reliability Evaluation for Cryogenic Impact Test Equipment.

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Title: Quantitative Reliability Evaluation for Cryogenic Impact Test Equipment.
Authors: Bae, Jae Il1, Park, Young IL1, parkyi1973@dau.ac.kr, Kim, Jeong-Hwan1, jhkim81@dau.ac.kr
Source: Applied Sciences (2076-3417); Oct2025, Vol. 15 Issue 20, p11280, 19p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 188953962
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PubType: Academic Journal
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  Data: Quantitative Reliability Evaluation for Cryogenic Impact Test Equipment.
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  Data: <searchLink fieldCode="AU" term="%22Bae%2C+Jae+Il%22">Bae, Jae Il</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Park%2C+Young+IL%22">Park, Young IL</searchLink><relatesTo>1</relatesTo>, <i>parkyi1973@dau.ac.kr</i><br /><searchLink fieldCode="AU" term="%22Kim%2C+Jeong-Hwan%22">Kim, Jeong-Hwan</searchLink><relatesTo>1</relatesTo>, <i>jhkim81@dau.ac.kr</i>
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      – Type: doi
        Value: 10.3390/app152011280
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      – Code: eng
        Text: English
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        PageCount: 19
        StartPage: 11280
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      – TitleFull: Quantitative Reliability Evaluation for Cryogenic Impact Test Equipment.
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            NameFull: Bae, Jae Il
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            NameFull: Park, Young IL
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              Text: Oct2025
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              Y: 2025
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