Gao, H., Liang, G., Fu, X., Zeng, H., & Li, L. (2025). Enhanced Photocurrents Produced in the BeN3 Photodetector by Point Defects. Journal of Electronic Materials, 54(12), 11510. https://doi.org/10.1007/s11664-025-12332-5
Chicago Style (17th ed.) CitationGao, Haixia, Guangyao Liang, Xi Fu, Hui Zeng, and Liming Li. "Enhanced Photocurrents Produced in the BeN3 Photodetector by Point Defects." Journal of Electronic Materials 54, no. 12 (2025): 11510. https://doi.org/10.1007/s11664-025-12332-5.
MLA (9th ed.) CitationGao, Haixia, et al. "Enhanced Photocurrents Produced in the BeN3 Photodetector by Point Defects." Journal of Electronic Materials, vol. 54, no. 12, 2025, p. 11510, https://doi.org/10.1007/s11664-025-12332-5.
Warning: These citations may not always be 100% accurate.