APA (7th ed.) Citation

Seniushin, I., Glazyrina, N., Atanbayev, Y., Bairamov, K., Satiyeva, Y., Nurman, O., & Altaibek, M. (2025). A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT. Applied Sciences (2076-3417), 15(22), 11991. https://doi.org/10.3390/app152211991

Chicago Style (17th ed.) Citation

Seniushin, Igor, Natalya Glazyrina, Yernat Atanbayev, Kamal Bairamov, Yenlik Satiyeva, Olzhas Nurman, and Mamyr Altaibek. "A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT." Applied Sciences (2076-3417) 15, no. 22 (2025): 11991. https://doi.org/10.3390/app152211991.

MLA (9th ed.) Citation

Seniushin, Igor, et al. "A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT." Applied Sciences (2076-3417), vol. 15, no. 22, 2025, p. 11991, https://doi.org/10.3390/app152211991.