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A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT.

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Title: A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT.
Authors: Seniushin, Igor1, Glazyrina, Natalya1,2, Atanbayev, Yernat2,3, Bairamov, Kamal1, Satiyeva, Yenlik2, Nurman, Olzhas1,3, Altaibek, Mamyr3, mameralt@outlook.com
Source: Applied Sciences (2076-3417); Nov2025, Vol. 15 Issue 22, p11991, 36p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 189610066
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PubType: Academic Journal
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        Value: 10.3390/app152211991
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              Text: Nov2025
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