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Investigation into Response Characteristics and Fault Diagnosis Methods for Intermittent Faults in High-Density Integrated Circuits Induced by Bonding Wires.

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Title: Investigation into Response Characteristics and Fault Diagnosis Methods for Intermittent Faults in High-Density Integrated Circuits Induced by Bonding Wires.
Authors: Yang, Wenxiang1,2, Zhang, Yong1,2, Cheng, Xianzhe3, Luo, Xinyu1,2, Liu, Guanjun1,2, Qiu, Jing1,2,3, Lyu, Kehong1,2, fhrlkh@163.com
Source: Applied Sciences (2076-3417); Jan2026, Vol. 16 Issue 2, p949, 29p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 191218343
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Investigation into Response Characteristics and Fault Diagnosis Methods for Intermittent Faults in High-Density Integrated Circuits Induced by Bonding Wires.
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  Data: <searchLink fieldCode="AU" term="%22Yang%2C+Wenxiang%22">Yang, Wenxiang</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Yong%22">Zhang, Yong</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Cheng%2C+Xianzhe%22">Cheng, Xianzhe</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Luo%2C+Xinyu%22">Luo, Xinyu</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Guanjun%22">Liu, Guanjun</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Qiu%2C+Jing%22">Qiu, Jing</searchLink><relatesTo>1,2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Lyu%2C+Kehong%22">Lyu, Kehong</searchLink><relatesTo>1,2</relatesTo>, <i>fhrlkh@163.com</i>
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=191218343
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.3390/app16020949
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 29
        StartPage: 949
    Titles:
      – TitleFull: Investigation into Response Characteristics and Fault Diagnosis Methods for Intermittent Faults in High-Density Integrated Circuits Induced by Bonding Wires.
        Type: main
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      – PersonEntity:
          Name:
            NameFull: Yang, Wenxiang
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            NameFull: Zhang, Yong
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            NameFull: Cheng, Xianzhe
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            NameFull: Luo, Xinyu
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            NameFull: Liu, Guanjun
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            NameFull: Qiu, Jing
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            NameFull: Lyu, Kehong
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            – D: 15
              M: 01
              Text: Jan2026
              Type: published
              Y: 2026
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            – TitleFull: Applied Sciences (2076-3417)
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