APA (7th ed.) Citation

Wang, K., Liu, L., Xu, C., Zou, J., Lin, H., Fang, N., & Jiang, J. (2026). Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models. Journal of Intelligent Manufacturing, 37(3), 1163. https://doi.org/10.1007/s10845-025-02589-2

Chicago Style (17th ed.) Citation

Wang, Kang, Lanqing Liu, Cheng Xu, Jing Zou, Haoneng Lin, Naiyu Fang, and Jingchao Jiang. "Towards Label-free Defect Detection in Additive Manufacturing via Dual-classifier Semi-supervised Learning for Vision-language Models." Journal of Intelligent Manufacturing 37, no. 3 (2026): 1163. https://doi.org/10.1007/s10845-025-02589-2.

MLA (9th ed.) Citation

Wang, Kang, et al. "Towards Label-free Defect Detection in Additive Manufacturing via Dual-classifier Semi-supervised Learning for Vision-language Models." Journal of Intelligent Manufacturing, vol. 37, no. 3, 2026, p. 1163, https://doi.org/10.1007/s10845-025-02589-2.