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Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models.

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Title: Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models.
Authors: Wang, Kang1, kang.wang@ntu.edu.sg, Liu, Lanqing2, Xu, Cheng2, cs-cheng.xu@polyu.edu.hk, Zou, Jing2, Lin, Haoneng2, Fang, Naiyu1, Jiang, Jingchao3
Source: Journal of Intelligent Manufacturing; Mar2026, Vol. 37 Issue 3, p1163-1178, 16p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 191838960
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PubType: Academic Journal
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s10845-025-02589-2
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      – Code: eng
        Text: English
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        PageCount: 16
        StartPage: 1163
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      – TitleFull: Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models.
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            NameFull: Wang, Kang
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            NameFull: Liu, Lanqing
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            NameFull: Xu, Cheng
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            NameFull: Lin, Haoneng
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            NameFull: Fang, Naiyu
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            NameFull: Jiang, Jingchao
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            – D: 01
              M: 03
              Text: Mar2026
              Type: published
              Y: 2026
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