Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models.
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| Title: | Towards label-free defect detection in additive manufacturing via dual-classifier semi-supervised learning for vision-language models. |
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| Authors: | Wang, Kang1, kang.wang@ntu.edu.sg, Liu, Lanqing2, Xu, Cheng2, cs-cheng.xu@polyu.edu.hk, Zou, Jing2, Lin, Haoneng2, Fang, Naiyu1, Jiang, Jingchao3 |
| Source: | Journal of Intelligent Manufacturing; Mar2026, Vol. 37 Issue 3, p1163-1178, 16p |
| Database: | Applied Science & Technology Source |
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