Direct Probing of Trap Dynamics in β‐Ga2O3 Schottky Barrier Diodes Using Single‐Voltage‐Pulse Characterization. - Vo, Thanh Huong; Kim, Sunjae; Park, Ji‐Hyeon; Jeon, Dae‐Woo; Hwang, Wan Sik; Hwang, Jinyoung (Advanced Science, 2026)